Module 4

Measurements

4.1 Four-point probe and Van Der Pauw measurements for carrier density

4.2 Resistivity and hall mobility

4.3 Hot-point probe measurement, capacitance-voltage measurements

4.4 Parameter extraction from diode I-V characteristics, DLTS

4.5 Band gap by UV-Vis spectroscopy, absorption/transmission

References:

1.J.Singh, Semiconductor Optoelectronics: Physics and Technology, McGraw-HillInc.(1995).

2.B.E.A .Saleh and M. C.Teich, Fundamentals of Photonics, John Wiley &Sons, Inc.,(2007).

3.S.M.Sze, Semiconductor Devices: Physicsand Technology, Wiley(2008).

4.A.Yariv and P.Yeh, Photonics: Optical Electronic sin Modern Communications ,Oxford University Press, New York(2007).

5.P.Bhattacharya, Semiconductor Optoelectronic Devices ,Prentice Hall of India(1997).

6. Engineering Physics by Dattu R Joshi, McGraw hill Publications.